Depth detection and fabrication of porous silicon without the stress-环境科学工程技术研究中心

Depth detection and fabrication of porous silicon without the stress

时间：2017-02-20 浏览：次【字体：大中小】

Dezhong Cao, Hongdi Xiao*, Hangzhou Xu, Qingxue Gao, Jin Ma, Xiangdong Liu, Haiyan Pei. Depth detection and fabrication of porous silicon without the stress. Applied Surface Science. 2016, 362: 557-561. (SCI, EI)

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